Identifying organic contaminants with breakthrough submicron IR and simultaneous Raman microscopy

Available for viewing

Presenters:
Dr. Mustafa Kansiz, Photothermal Spectroscopy Corp
Dr. Dennis Walls, Dupont

Successfully identifying contaminants is a critical step in ensuring that both product quality and yield are maintained during failure analysis. With ever stricter control standards and the shrinking size of high-tech products, confidently identifying smaller contaminants is becoming increasingly important. While high spatial resolution techniques exist for elemental and inorganic analysis, identification of organic contamination at the micron and submicron scale has been challenging.

Identifying organic contaminants with breakthrough submicron IR and simultaneous Raman microscopy

Available for viewing

Presenters:
Dr. Mustafa Kansiz, Photothermal Spectroscopy Corp
Dr. Dennis Walls, Dupont

Successfully identifying contaminants is a critical step in ensuring that both product quality and yield are maintained during failure analysis. With ever stricter control standards and the shrinking size of high-tech products, confidently identifying smaller contaminants is becoming increasingly important. While high spatial resolution techniques exist for elemental and inorganic analysis, identification of organic contamination at the micron and submicron scale has been challenging.