O-PTIR: Beyond the limits of traditional IR microscopy

Submicron IR
spatial resolution

Non-contact measurement

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Submicron IR
spatial resolution

Non-contact
measurement

Problem solved.

O-PTIR utilizes a co-linear visible light source to detect IR absorption, resulting in non-contact measurement, thus requiring little to no sample preparation before analysis. Since the light “probe” is used to detect the thermal expansion of the sample, spatial resolution is independent of the IR light and submicron IR spatial resolution is achieved.

“This is truly an exciting technology. The quality of the spectral data, at such high level of spatial resolution, is amazing.”

Professor John Reffner
John Jay College of
Criminal Justice (CUNY)
Pioneer in FTIR microspectroscopy

Spectra on thick samples that correlate to transmission FTIR

O-PTIR provides the best of both worlds, combining the convenience of a non-contact reflection mode technique with the quality of Transmission FTIR spectra.

Below: Three different O-PTIR spectra collected off of samples of 20 µm thick (below) were searched against the KnowItAll® database with high matches for polystyrene (PS) (left), polyethylene terephthalate (PET) (middle) and polymethyl methacrylate (PMMA) (right).