O-PTIR non-contact submicron visible probe infrared spectroscopy
The use of O-PTIR non-contact submicron visible probe to detect the photothermal IR effect is the key breakthrough. It enables non-contact, submicron IR spectroscopy in reflection mode. This provides new analytical capabilities to analyse polymers, life science samples, particulates and more.
O-PTIR non-contact submicron visible probe infrared spectroscopy
Problem solved.
O-PTIR non-contact submicron visible probe detection of the photothermal IR effect overcomes the key limitation of traditional FTIR/QCL microscopy. It does this by removing the fundamental spatial resolution limits of IR spectroscopy (10-20 microns). This limit is now governed by the visible beam wavelength. O-PTIR achieves submicron spatial resolution, all in non-contact, reflection mode operation.
“This is truly an exciting technology. The quality of the spectral data, at such high level of spatial resolution, is amazing.”
John Jay College of
Criminal Justice (CUNY)
Pioneer in FTIR microspectroscopy
Spectra on thick samples that correlate to transmission FTIR
O-PTIR provides the best of both worlds. It combines the convenience of a non-contact reflection mode technique with “FTIR transmission-like” quality. The spectra are collected in reflection mode, where thickness, surface roughness or particle shape/size are not issues.
Below: Three different O-PTIR spectra collected off of samples of 20 µm thick (below) were searched against the KnowItAll® database. The results were high matches for polystyrene (PS) (left), polyethylene terephthalate (PET) (middle) and polymethyl methacrylate (PMMA) (right).
mIRage combines O-PTIR and Raman
to improve results
The world’s first simultaneous IR+Raman microscopy system is a unique dual modality platform that combines all the advantages of O-PTIR with complementary Raman microscopy via simultaneous detection of the visible probe laser.