O-PTIR non-contact submicron visible probe infrared spectroscopy
The use of O-PTIR non-contact submicron visible probe to detect the photothermal IR effect is the key breakthrough. It enables non-contact, submicron IR spectroscopy in reflection mode. This provides new analytical capabilities to analyse polymers, life science samples, particulates and more.
Problem solved.
O-PTIR non-contact submicron visible probe detection of the photothermal IR effect overcomes the key limitation of traditional FTIR/QCL microscopy. It does this by removing the fundamental spatial resolution limits of IR spectroscopy (10-20 microns). This limit is now governed by the visible beam wavelength. O-PTIR achieves submicron spatial resolution, all in non-contact, reflection mode operation.
John Jay College of
Criminal Justice (CUNY)
Pioneer in FTIR microspectroscopy
Spectra on thick samples that correlate to transmission FTIR
O-PTIR provides the best of both worlds. It combines the convenience of a non-contact reflection mode technique with “FTIR transmission-like” quality. The spectra are collected in reflection mode, where thickness, surface roughness or particle shape/size are not issues.
Below: Three different O-PTIR spectra collected off of samples of 20 µm thick (below) were searched against the KnowItAll® database. The results were high matches for polystyrene (PS) (left), polyethylene terephthalate (PET) (middle) and polymethyl methacrylate (PMMA) (right).
mIRage combines O-PTIR and Raman
to improve results
The world’s first simultaneous IR+Raman microscopy system is a unique dual modality platform that combines all the advantages of O-PTIR with complementary Raman microscopy via simultaneous detection of the visible probe laser.
Photothermal Spectroscopy Corp
325 Chapala Street
Santa Barbara, CA 93101
Phone: (805) 845-6568
Email: info [at] photothermal.com